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IOP Publishing, Journal of Physics: Condensed Matter, 32(32), p. 323001, 2020

DOI: 10.1088/1361-648x/ab8091

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Characterisation of negative-U defects in semiconductors

Journal article published in 2020 by Jose Coutinho ORCID, Vladimir P. Markevich ORCID, Anthony R. Peaker ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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