Published in

Royal Society of Chemistry, Journal of Materials Chemistry C Materials for optical and electronic devices, 6(8), p. 1972-1980, 2020

DOI: 10.1039/c9tc05759e

Links

Tools

Export citation

Search in Google Scholar

Interface modification of sputtered NiOx as the hole-transporting layer for efficient inverted planar perovskite solar cells

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Orange circle
Postprint: archiving restricted
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO

Abstract

An appropriately combined triple interface modification, i.e., post-annealing, O2-plasma, and KCl treatments, is employed to ameliorate the optoelectronic properties of sputtered NiOx films and achieve better device performance.