Published in
Royal Society of Chemistry, CrystEngComm, 2(22), p. 283-292, 2020
DOI: 10.1039/c9ce01498e
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Structural and optical characterization of dilute phosphide planar heterostructures with high nitrogen content on silicon
Journal article published in 2020 by
Olga Y.-U. Koval 
,
Vladimir V. Fedorov ,
Natalia V. Kryzhanovskaya ,
Georgiy A. Sapunov ,
Demid A. Kirilenko,
Evgeniy V. Pirogov,
Nikolay G. Filosofov,
Aleksei Y.-U. Serov,
Igor V. Shtrom,
Alexey D. Bolshakov ,
Ivan S. Mukhin
,
Vladimir V. Fedorov ,
Natalia V. Kryzhanovskaya ,
Georgiy A. Sapunov ,
Demid A. Kirilenko,
Evgeniy V. Pirogov,
Nikolay G. Filosofov,
Aleksei Y.-U. Serov,
Igor V. Shtrom,
Alexey D. Bolshakov ,
Ivan S. Mukhin
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Abstract
Despite poor crystallinity, a dilute nitride phosphide heterostructure with 5% nitrogen content demonstrates PL response at RT centered at 1.76 eV.