Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films
Journal article published in 2019 by
C. Trager-Cowan,
A. Alasmari,
W. Avis,
J. Bruckbauer,
P. R. Edwards,
B. Hourahine 
,
S. Kraeusel,
G. Kusch,
R. Johnston,
G. Naresh-Kumar,
R. W. Martin,
M. Nouf-Allehiani,
E. Pascal,
L. Spasevski,
D. Thomson
and other authors.
,
S. Kraeusel,
G. Kusch,
R. Johnston,
G. Naresh-Kumar,
R. W. Martin,
M. Nouf-Allehiani,
E. Pascal,
L. Spasevski,
D. Thomson
and other authors.
This paper was not found in any repository, but could be made available legally by the author.
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