Published in
Royal Society of Chemistry, Journal of Materials Chemistry C Materials for optical and electronic devices, 37(7), p. 11473-11482, 2019
DOI: 10.1039/c9tc03507a
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Electron and hole trapping in Eu- or Eu,Hf-doped LuPO4 and YPO4 tracked by EPR and TSL spectroscopy
Journal article published in 2019 by
Valentin Laguta 
,
Maksym Buryi,
Martin Nikl ,
Justyna Zeler ,
Eugeniusz Zych ,
Marco Bettinelli
,
Maksym Buryi,
Martin Nikl ,
Justyna Zeler ,
Eugeniusz Zych ,
Marco Bettinelli
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Abstract
EPR spectroscopy in X- and Q-bands was employed to trace charge carrier trapping upon exposure to X-rays of LuPO4:Eu, LuPO4:Eu,Hf and YPO4:Eu,Hf flux-grown single crystals, as well as LuPO4:Eu sintered ceramics.