Current-induced degradation and lifetime prediction of 310 nm ultraviolet light-emitting diodes
Journal article published in 2019 by
Jan Ruschel 
,
Johannes Glaab ,
Batoul Beidoun,
Neysha Lobo Ploch,
Jens Rass,
Tim Kolbe,
Arne Knauer,
Markus Weyers ,
Sven Einfeldt,
Michael Kneissl
,
Johannes Glaab ,
Batoul Beidoun,
Neysha Lobo Ploch,
Jens Rass,
Tim Kolbe,
Arne Knauer,
Markus Weyers ,
Sven Einfeldt,
Michael Kneissl
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Published version:
archiving forbidden
Data provided by 