Published in

Nanoscale Advances, 5(1), p. 1784-1790, 2019

DOI: 10.1039/c8na00373d

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Realization and direct observation of five normal and parametric modes in silicon nanowire resonators by in situ transmission electron microscopy

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Data provided by SHERPA/RoMEO

Abstract

In situ TEM observation of the 5th order normal and parametric resonances for precise evaluation of Si NWs' elastic moduli.