Published in
Royal Society of Chemistry, Journal of Analytical Atomic Spectrometry, 4(34), p. 702-707, 2019
DOI: 10.1039/c8ja00334c
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Plasma profiling-time of flight mass spectrometry: considerations to exploit its analytical performance for materials characterization
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Abstract
The combination of pulsed glow discharge (PGD) with time-of-flight mass spectrometry (TOFMS) provides quasi-simultaneous mass spectra of fast transient signals directly from solid materials.