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Published in

Royal Society of Chemistry, CrystEngComm, 14(21), p. 2281-2285, 2019

DOI: 10.1039/c8ce01906a

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Lattice-plane bending angle modulation of Mg-doped GaN homoepitaxial layer observed by X-ray diffraction topography

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

We have studied the lattice-plane modulation of Mg-doped GaN homoepitaxial layers by X-ray diffraction topography.