Published in
Royal Society of Chemistry, Chemical Communications, 4(55), p. 482-485, 2019
DOI: 10.1039/c8cc07912a
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Heavy atom labeling enables silanol defect visualization in silicalite-1 crystals
Journal article published in 2019 by
Teng Li 
,
Frank Krumeich,
Johannes Ihli,
Zhiqiang Ma,
Takashi Ishikawa,
Ana B. Pinar,
Jeroen A. van Bokhoven
,
Frank Krumeich,
Johannes Ihli,
Zhiqiang Ma,
Takashi Ishikawa,
Ana B. Pinar,
Jeroen A. van Bokhoven
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Abstract
A heavy-atom labeling approach in conjunction with electron microscopy allows visualization of the distribution of silanol defects at the single crystal level.