Published in

Royal Society of Chemistry, Physical Chemistry Chemical Physics, 1(21), p. 427-437, 2019

DOI: 10.1039/c8cp07101b

Links

Tools

Export citation

Search in Google Scholar

Multi-electron reduction of Wells–Dawson polyoxometalate films onto metallic, semiconducting and dielectric substrates

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Orange circle
Postprint: archiving restricted
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO

Abstract

The thermally-induced multi-electron reduction of [P2Mo18O62]6−anions onto dielectric substrate (SiO2) under ambient conditions is attributed to the oxidation of ammonium counterions.