Published in
2018 IEEE International Electron Devices Meeting (IEDM)
DOI: 10.1109/iedm.2018.8614687
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Suppressed Hole-Induced Degradation in E-mode GaN MIS-FETs with Crystalline $\text{GaO}_{\mathrm{x}}\mathrm{N}_{1-\mathrm{x}}$ Channel
Proceedings article published in 2018 by
Mengyuan Hua,
Xiangbin Cai 
,
Song Yang,
Zhaofu Zhang,
Zheyang Zheng,
Jin Wei ,
Ning Wang,
Kevin J. Chen
,
Song Yang,
Zhaofu Zhang,
Zheyang Zheng,
Jin Wei ,
Ning Wang,
Kevin J. Chen
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