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Elsevier, Computers and Electronics in Agriculture, (154), p. 411-419

DOI: 10.1016/j.compag.2018.09.032

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A novel method using MOS electronic nose and ELM for predicting postharvest quality of cherry tomato fruit treated with high pressure argon

Journal article published in 2018 by Lei Feng, Min Zhang ORCID, Bhesh Bhandari ORCID, Zhimei Guo
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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