Published in
Royal Society of Chemistry, Journal of Materials Chemistry C Materials for optical and electronic devices, 35(6), p. 9501-9509, 2018
DOI: 10.1039/c8tc03330g
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Metal oxide double layer capacitors by electrophoretic deposition of metal oxides. Fabrication, electrical characterization and defect analysis using positron annihilation spectroscopy
Journal article published in 2018 by
Rudolf C. Hoffmann,
Nico Koslowski,
Shawn Sanctis 
,
Maciej O. Liedke,
Andreas Wagner ,
Maik Butterling ,
Jörg J. Schneider
,
Maciej O. Liedke,
Andreas Wagner ,
Maik Butterling ,
Jörg J. Schneider
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Abstract
Electrophoretic deposition provides an attractive access to semiconductor/conductor bilayers which can be complemented to functional devices like MOS capacitors.