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American Institute of Physics, Journal of Applied Physics, 16(123), p. 161559

DOI: 10.1063/1.5011327

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Tutorial: Junction spectroscopy techniques and deep-level defects in semiconductors

Journal article published in 2018 by A. R. Peaker ORCID, Peaker,A R., V. P. Markevich ORCID, Markevich,V P., Coutinho,J, José Coutinho ORCID
This paper is available in a repository.
This paper is available in a repository.

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