Published in
Royal Society of Chemistry, Journal of Analytical Atomic Spectrometry, 9(33), p. 1559-1563
DOI: 10.1039/c8ja00087e
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A novel sample preparation method for ultra-high vacuum (UHV) secondary ion mass spectrometry (SIMS) analysis
Journal article published in 2018 by
Wanfeng Zhang 
,
Xiaoping Xia ,
Yanqiang Zhang,
Touping Peng,
Qing Yang
,
Xiaoping Xia ,
Yanqiang Zhang,
Touping Peng,
Qing Yang
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