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Royal Society of Chemistry, CrystEngComm, 20(20), p. 2861-2867

DOI: 10.1039/c8ce00229k

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Synchrotron X-ray diffraction characterization of the inheritance of GaN homoepitaxial thin films grown on selective growth substrates

Journal article published in 2018 by Yanfang Lou, Chulho Song ORCID, Yanna Chen, Loku Singgappulige Rosantha Kumara ORCID, Natalia Palina ORCID, Okkyun Seo ORCID, Satoshi Hiroi, Kentaro Kajiwara, Masato Hoshino, Kentaro Uesugi, Yoshihiro Irokawa, Toshihide Nabatame, Yasuo Koide, Osami Sakata ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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