Published in
Royal Society of Chemistry, Nanoscale, 10(10), p. 4833-4840
DOI: 10.1039/c7nr07990g
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Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging
Journal article published in 2018 by
Marie-Ingrid Richard 
,
Sara Fernández,
Joël Eymery,
Jan Philipp Hofmann ,
Lu Gao ,
Jérôme Carnis ,
Stéphane Labat,
Vincent Favre-Nicolin,
Emiel J. M. Hensen ,
Olivier Thomas,
Tobias U. Schülli,
Steven J. Leake
,
Sara Fernández,
Joël Eymery,
Jan Philipp Hofmann ,
Lu Gao ,
Jérôme Carnis ,
Stéphane Labat,
Vincent Favre-Nicolin,
Emiel J. M. Hensen ,
Olivier Thomas,
Tobias U. Schülli,
Steven J. Leake
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Abstract
A novel approach based on nano-focused coherent Bragg X-ray imaging to characterise the crystallographic planes at the surface of single nanostructures and planar defects.