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Royal Society of Chemistry, Analytical Methods, 20(10), p. 2303-2306

DOI: 10.1039/c8ay00568k

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Discrimination of positional isomers by ion mobility mass spectrometry: application to organic semiconductors

Journal article published in 2018 by Quentin Duez, Maxime Romain, Corentin Tonneaux, Julien De Winter ORCID, Vincent Lemaur ORCID, Jérôme Cornil ORCID, Cyril Poriel ORCID, Pascal Gerbaux ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

Ion mobility mass spectrometry is introduced as a versatile technique for positional isomerism discrimination in the field of organic-based optoelectronics.