Matteo Rapisarda
0000-0002-2629-3855
49 papers found
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Polyfluorinated Naphthalene-bis-hydrazimide for Solution-Grown n-Type Semiconducting Films
Low Frequency Noise in DNTT/Cytop™ Based Organic Thin Film Transistors
Flexible Organic Phototransistors With Limit of Detection Down to 28 pW/cm2
Highly sensitive organic phototransistor for flexible optical detector arrays
Electrical instability in short channel organic thin-film transistors induced by lucky-polaron mechanism
Hybrid Electrothermal Simulations of GaN HEMT Devices Based on Self-Heating Free Virtual Electrical Characteristics
Effect of Drain Top Metal Overlap on the Current in Bottom-gate Thin Film Transistors
Gravure printed organic thin film transistors: Study on the ink printability improvement
Three-dimensional characterization of OTFT on modified hydrophobic flexible polymeric substrate by low energy Cs + ion sputtering
Staggered top-gate PDIF-CN2 N-type thin film transistors on flexible plastic substrates
A large signal non quasi static model of printed organic TFTs and simulation of CMOS circuits
Logic gates and memory elements design and simulation using PMOS organic transistor
A DC and small signal AC model for organic thin film transistors including contact effects and non quasi static regime
Investigation of Gate Direct-Current and Fluctuations in Organic p-Type Thin-Film Transistors
A large signal non quasi static compact model for printed organic thin film transistors
Publisher’s Note: “High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors” [Rev. Sci. Instrum. 87, 044702 (2016)]
High sensitivity measurement system for the direct-current, capacitance-voltage, and gate-drain low frequency noise characterization of field effect transistors
The Role of Defective Regions Near the Contacts on the Electrical Characteristics of Bottom-Gate Bottom-Contact Organic TFTs
Contact Effects in Organic Thin-Film Transistors: Device Physics and Modeling
Correlated Mobility Fluctuations and Contact Effects in p-Type Organic Thin-Film Transistors
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