All papers authored by Giuseppe Scardera
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2022
Mattias Klaus Juhl,
Binesh Puthen Veettil,
Giuseppe Scardera 
,
David Neil Roger Payne
,
David Neil Roger Payne
Determining the optical properties of solar cells using low cost scanners
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Yu Zhang ,
Giuseppe Scardera ,
Shaozhou Wang ,
Malcolm Abbott,
David Payne ,
Bram Hoex
,
Giuseppe Scardera ,
Shaozhou Wang ,
Malcolm Abbott,
David Payne ,
Bram Hoex
Scanning Electron Microscopy Dopant Contrast Imaging of Phosphorus‐Diffused Silicon
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Shaozhou Wang ,
Tong Xie,
Ran Liang,
Yu Zhang ,
Fa-Jun Ma,
David Payne,
Giuseppe Scardera ,
Bram Hoex
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,
Tong Xie,
Ran Liang,
Yu Zhang ,
Fa-Jun Ma,
David Payne,
Giuseppe Scardera ,
Bram Hoex
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Shuai Zou ,
Xiaoya Ye,
Jianming Ding,
Chengkun Wu ,
Shaozhou Wang,
Giuseppe Scardera ,
Malcolm Abbott,
Yu Zhang,
Ronglei Fan,
Yadong Xu,
Xusheng Wang,
Mingrong Shen,
Xiaodong Su
,
Xiaoya Ye,
Jianming Ding,
Chengkun Wu ,
Shaozhou Wang,
Giuseppe Scardera ,
Malcolm Abbott,
Yu Zhang,
Ronglei Fan,
Yadong Xu,
Xusheng Wang,
Mingrong Shen,
Xiaodong Su
A solid strategy to realize heteroface selective emitter and rear passivated silicon solar cells
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Yu Zhang ,
Tom Veeken ,
Shaozhou Wang,
Giuseppe Scardera ,
Malcolm Abbott,
David Payne,
Albert Polman ,
Bram Hoex
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,
Tom Veeken ,
Shaozhou Wang,
Giuseppe Scardera ,
Malcolm Abbott,
David Payne,
Albert Polman ,
Bram Hoex
Download from onlinelibrary.wiley.com
2021
Giuseppe Scardera ,
David Payne,
Muhammad Khan,
Yu Zhang,
Anastasia Soeriyadi ,
Shuai Zou,
Daqi Zhang,
Rasmus Davidsen ,
Ole Hansen ,
Bram Hoex ,
Malcolm Abbott
,
David Payne,
Muhammad Khan,
Yu Zhang,
Anastasia Soeriyadi ,
Shuai Zou,
Daqi Zhang,
Rasmus Davidsen ,
Ole Hansen ,
Bram Hoex ,
Malcolm Abbott
Silicon Nanotexture Surface Area Mapping Using Ultraviolet Reflectance
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2017
Giuseppe Scardera ,
C. C. Torardi,
P. D. VerNooy,
Q. Guo,
R. Petres,
S. Dugan,
B. J. Laughlin
,
C. C. Torardi,
P. D. VerNooy,
Q. Guo,
R. Petres,
S. Dugan,
B. J. Laughlin
Optimized PERC Silver Paste for High Efficiency Emitters
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Kristopher O. Davis,
Marianne P. Rodgers,
Giuseppe Scardera ,
R. Paul Brooker,
Hubert Seigneur,
Nahid Mohajeri,
Neelkanth G. Dhere,
John Wohlgemuth,
Eric Schneller,
Narendra Shiradkar,
Andrew C. Rudack,
Winston V. Schoenfeld
,
R. Paul Brooker,
Hubert Seigneur,
Nahid Mohajeri,
Neelkanth G. Dhere,
John Wohlgemuth,
Eric Schneller,
Narendra Shiradkar,
Andrew C. Rudack,
Winston V. Schoenfeld
Manufacturing metrology for c-Si module reliability and durability Part II: Cell manufacturing
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Eric J. Schneller,
R. Paul Brooker,
Narendra S. Shiradkar,
Marianne P. Rodgers,
Neelkanth G. Dhere,
Kristopher O. Davis,
Hubert P. Seigneur,
Nahid Mohajeri,
John Wohlgemuth,
Giuseppe Scardera ,
Andrew C. Rudack,
Winston V. Schoenfeld
,
Andrew C. Rudack,
Winston V. Schoenfeld
Manufacturing metrology for c-Si module reliability and durability Part III: Module manufacturing
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