In-Tak Cho
0000-0002-3588-1042
3 papers found
Refreshing results…
Effects of temperature and DC cycling stress on resistive switching mechanisms in hafnia-based ferroelectric tunnel junction
A source drain symmetric and interchangeable bidirectional tunneling field effect transistor
Elimination of the gate and drain bias stresses in I–V characteristics of WSe2 FETs by using dual channel pulse measurement
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