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Papers authored by Chris Fancher

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2016 Dipak Kumar Khatua, Lalitha K. V., Chris M. Fancher

, Rajeev Ranjan

Anomalous reduction in domain wall displacement at the morphotropic phase boundary of the piezoelectric alloy systemPbTiO3−BiScO3

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Giovanni Esteves, Margeaux Wallace, Raegan Johnson-Wilke, Chris M. Fancher

, Rudeger H. T. Wilke, Susan Trolier-Mckinstry, Jacob L. Jones

Effect of Mechanical Constraint on Domain Reorientation in Predominantly {111}-Textured Lead Zirconate Titanate Films

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2015 Lili Zhao, Dong Hou, Tedi-Marie Usher, Thanakorn Iamsasri, Chris M. Fancher

, Jennifer S. Forrester, Toshikazu Nishida, Saeed Moghaddam, Jacob L. Jones

Structure of 3 at.% and 9 at.% Si-doped HfO2 from combined refinement of X-ray and neutron diffraction patterns

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Chris M. Fancher

, Meghdad Palizdar, Tim J. Stevenson, Tim P. Comyn, Stephen F. Poterala, Gary L. Messing, Ender Suvaci, Annette P. Kleppe, Andrew J. Jephcoat, Andrew J. Bell

Characterization of thick bismuth ferrite–lead titanate films processed by tape casting and templated grain growth

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Matthew J. Burch, David T. Harris, Chris M. Fancher

, Jon-Paul Maria, Elizabeth C. Dickey

Domain Structure of Bulk and Thin-Film Ferroelectrics By Transmission Kikuchi Diffraction

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J. Houston Dycus, J. Houston Dycus, Joshua S. Harris, Xiahan Sang, Chris M. Fancher

, Scott D. Findlay

, Adedapo A. Oni, Tsung-Ta E. Chan, Carl C. Koch, Jacob L. Jones

, Leslie J. Allen, Douglas L. Irving, James M. LeBeau

Accurate Nanoscale Crystallography in Real-Space Using Scanning Transmission Electron Microscopy

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Dong Hou

, Chris M. Fancher

, Lili Zhao, Giovanni Esteves, Jacob L. Jones

Processing and crystallographic structure of non-equilibrium Si-doped HfO2

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Chris M. Fancher

, Lili Zhao, Matthew Nelson, Ligang Bai, Guoyin Shen

, Jacob L. Jones

Pressure-induced structures of Si-doped HfO2

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Patrick D. Lomenzo, Qanit Takmeel, Chris M. Fancher

, Chuanzhen Zhou, Chuanzhen Zhou, Nicholas G. Rudawski, Saeed Moghaddam, Jacob L. Jones

, Toshikazu Nishida

Ferroelectric Si-Doped HfO2 Device Properties on Highly Doped Germanium

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Patrick D. Lomenzo, Qanit Takmeel, Chuanzhen Zhou

, Chris M. Fancher

, Eric Lambers

, Nicholas G. Rudawski, Jacob L. Jones

, Saeed Moghaddam, Toshikazu Nishida

TaN interface properties and electric field cycling effects on ferroelectric Si-doped HfO2 thin films

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M. Wallace

, R. L. Johnson-Wilke, G. Esteves, C. M. Fancher

, R. H. T. Wilke, J. L. Jones

, S. Trolier-Mckinstry

In situ measurement of increased ferroelectric/ferroelastic domain wall motion in declamped tetragonal lead zirconate titanate thin films

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Giovanni Esteves, Chris M. Fancher

, Jacob L. Jones

In situ characterization of polycrystalline ferroelectrics using x-ray and neutron diffraction – ERRATUM

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Lalitha Kv, Lalitha K. V., K. Lalitha

, Chris M. Fancher

, Jacob L. Jones

, Rajeev Ranjan

Field induced domain switching as the origin of anomalous lattice strain along non-polar direction in rhombohedral BiScO3-PbTiO3 close to the morphotropic phase boundary

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2014 Alberto Biancoli, Chris M. Fancher

, Jacob L. Jones

, Dragan Damjanovic

Breaking of macroscopic centric symmetry in paraelectric phases of ferroelectric materials and implications for flexoelectricity

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Giovanni Esteves, Chris M. Fancher

, Jacob L. Jones

In situ characterization of polycrystalline ferroelectrics using x-ray and neutron diffraction

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Patrick D. Lomenzo, Qanit Takmeel, Chuanzhen Zhou, Yang Liu, Chris M. Fancher

, Jacob L. Jones

, Saeed Moghaddam, Toshikazu Nishida

The effects of layering in ferroelectric Si-doped HfO2 thin films

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Meghdad Palizdar, Dhiman Mallick, Tuhin Maity, Saibal Roy, Tim P. Comyn, Tim J. Stevenson, Chris M. Fancher

, Jacob L. Jones, Stephen F. Poterala, Gary L. Messing, Ender Suvaci, Annette P. Kleppe, Andrew J. Jehcoat, Andrew J. Bell

Texture analysis of thick bismuth ferrite lead titanate layers

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Patrick D. Lomenzo, Peng Zhao, Qanit Takmeel, Saeed Moghaddam, Toshikazu Nishida, Matthew Nelson, Chris M. Fancher

, Everett D. Grimley, Xiahan Sang, James M. LeBeau, Jacob L. Jones

Ferroelectric phenomena in Si-doped HfO2 thin films with TiN and Ir electrodes

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Lili Zhao, Matthew Nelson, Henry Aldridge, Thanakorn Iamsasri, Chris M. Fancher

, Jennifer S. Forrester, Toshikazu Nishida, Saeed Moghaddam, Jacob L. Jones

Crystal structure of Si-doped HfO2

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2013 Chris M. Fancher

, Thanakorn Iamsasri, John E. Blendell, Keith J. Bowman

Effect of Crystallographic Texture on the Field-Induced-Phase Transformation Behavior of Bi0.5Na0.5TiO3−7BaTiO3−2K0.5Na0.5NbO3

Download from dx.doi.org

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Papers authored by Chris Fancher