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Configuration Memory Scrubbing of SRAM-Based FPGAs Using a Mixed 2-D Coding Technique
UploadImpact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies
UploadSingle Event Effect Testing With Ultrahigh Energy Heavy Ion Beams
UploadDirect Ionization Impact on Accelerator Mixed-Field Soft-Error Rate
UploadCharacterizing High-energy Ion Beams with PIPS Detectors
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