Chris McConville - Dissemin

Papers authored by Chris McConville

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2012 S. K. Vasheghani Farahani, T. D. Veal, A. M. Sanchez, O. Bierwagen, M. E. White, S. Gorfman, P. A. Thomas, J. S. Speck, C. F. McConville

Influence of charged-dislocation density variations on carrier mobility in heteroepitaxial semiconductors: The case of SnO2on sapphire

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L. Fishwick, M. Walker, M. K. (Matthew K.) Bradley, D. P. Woodruff, C. F. (Chris F.) McConville

Surface structure of GaP(110) : ion scattering and density functional theory study

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Y. Yao, J. D. Aldous, D. Won, J. M. Redwing, W. Linhart, C. F. McConville

, R. J. Reeves, Tim D. Veal, S. M. Durbin

Epitaxial InGaN on Nitridated Si(111) for Photovoltaic Applications

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Jessica H. Chai, Thomas H. Myers, Young-Wook Song, Roger J. Reeves, Wojciech M. Linhart, Richard J. H. (Richard J. H.) Morris, Timothy D. (Tim D.) Veal, Mark G. Dowsett, Christopher F. (Chris F.) McConville

, Steven M. Durbin

MBE growth and characterization of Mn-doped InN

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W. M. Linhart, J. Chai, R. J. H. (Richard J. H.) Morris, M. G. Dowsett, C. F. (Chris F.) McConville

, S. M. Durbin, Tim D. (Tim D.) Veal

Giant Reduction of InN Surface Electron Accumulation: Compensation of Surface Donors by Mg Dopants

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Ö. Tuna, W. M. Linhart, E. V. Lutsenko, M. V. Rzheutski, G. P. Yablonskii, C. F. (Chris F.) McConville

, Tim D. (Tim D.) Veal, C. Giesen, A. Vescan, H. Kalisch, M. Heuken

Structural, electrical and optical characterization of MOCVD grown In-rich InGaN layers

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2011 W. M. Linhart, Ö. Tuna, James J. Mudd, Tim D. (Tim D.) Veal, C. Giesen, M. Heuken, C. F. (Chris F.) McConville

Surface electronic properties of In-rich InGaN alloys grown by MOCVD

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M. Walker, M. G. Brown, M. Draxler, M. G. Dowsett, C. F. McConville

, T. C. Q. Noakes, P. Bailey

Structural analysis of the Cu(100)–p(32×2)R45°–Sn surface using low and medium energy ion scattering spectroscopies

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T. D. (Tim D.) Veal, P. D. C. King, C. F. (Chris F.) McConville

Electronic properties of post-transition metal oxide semiconductor surfaces

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K. H. L. Zhang, V. K. Lazarov, T. D. Veal, F. E. Oropeza, C. F. McConville

, R. G. Egdell, A. Walsh

Thickness dependence of the strain, band gap and transport properties of epitaxial In₂O₃thin films grown on Y-stabilised ZrO₂(111)

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S. K. Vasheghani Farahani, T. D. Veal, P. D. C. King, J. Zúñiga-Pérez, V. Muñoz-Sanjosé, C. F. McConville

Electron mobility in CdO films

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M. W. Allen, Dmitry Y. Zemlyanov, G. I. N. Waterhouse, J. B. Metson, C. F. (Chris F.) McConville

, Tim D. (Tim D.) Veal, S. M. Durbin

Polarity effects in the x-ray photoemission of ZnO and other wurtzite semiconductors

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Marc Walker, M. G. Brown, M. Draxler, M. G. Dowsett, C. F. (Chris F.) McConville

, T. C. Q. Noakes, P. Bailey

Structural analysis of the Cu(100)-p(2×2)-Sn surface using low and medium energy ion scattering spectroscopies

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Marc Walker, M. G. Brown, M. Draxler, L. Fishwick, M. G. Dowsett, C. F. (Chris F.) McConville

Analysis of the interactions between He+ ions and transition metal surfaces using co-axial impact collision ion scattering spectroscopy

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L. R. Bailey, Tim D. (Tim D.) Veal, C. F. (Chris F.) McConville

Stable passivation of InN surface electron accumulation with sulphur treatment

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2010 T. C. Q. Noakes, P. Bailey, C. F. McConville

, M. Draxler, M. Walker, M. G. Brown, A. Hentz, D. P. Woodruff, T. A. Lograsso, A. R. Ross, J. A. Smerdon, L. Leung, R. McGrath

Two- and three-dimensional growth of Bi oni-Al-Pd-Mn studied using medium-energy ion scattering

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Daniel Crispin Sheppard, Marc Walker, C. F. (Chris F.) McConville

, D. P. Woodruff, T. C. Q. Noakes, P. (Paul) Bailey

Thiolate-induced lateral distortion of the Cu(100) surface

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R. J. H. (Richard J. H.) Morris, M. G. Dowsett, R. Beanland, P. J. Parbrook, C. F. (Chris F.) McConville

Accurate ultra-low-energy secondary ion mass spectrometry analysis of wide bandgap GaN/InxGa1-xN structures using optical conductivity enhancement

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C. Rauch, F. Reurings, F. Tuomisto, T. D. Veal, C. F. McConville

, H. Lu, W. J. Schaff, C. S. Gallinat, G. Koblmüller, J. S. Speck, W. Egger, B. Löwe, L. Ravelli, S. Sojak

In‐vacancies in Si‐doped InN

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M. W. Allen, C. H. Swartz, T. H. Myers, Tim D. (Tim D.) Veal, C. F. (Chris F.) McConville

, S. M. Durbin

Bulk transport measurements in ZnO: The effect of surface electron layers

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Papers authored by Chris McConville