Nicolas Chevalier
0000-0002-4011-8746
Univ. Grenoble Alpes, CEA, LETI
6 papers found
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Characterization of GaN structures for power electronics by secondary ion mass spectrometry and atomic force microscope approach
Correlating chemical and electronic states from quantitative photoemission electron microscopy of transition-metal dichalcogenide heterostructures
Erratum: “Sub-10 nm spatial resolution for electrical properties measurements using bimodal excitation in electric force microscopy” [Rev. Sci. Instrum. 92, 023703 (2021)]
Sub-10 nm spatial resolution for electrical properties measurements using bimodal excitation in electric force microscopy
Impact of Pt on the phase formation sequence, morphology, and electrical properties of Ni(Pt)/Ge0.9Sn0.1 system during solid-state reaction
A scanning probe microscopy study of nanostructured TiO2/poly(3-hexylthiophene) hybrid heterojunctions for photovoltaic applications
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