Kay-Obbe Voss
0000-0003-2854-0060
4 papers found
Refreshing results…
Energy Deposition by Ultrahigh Energy Ions in Large and Small Sensitive Volumes
Heavy-Ion Microbeam Studies of Single Event Leakage Current Mechanism in SiC VD-MOSFETs
Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA using Very/Ultra-High Energy Heavy Ions
Microbeam SEE Analysis of MIM Capacitors for GaN Amplifiers
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