Wolfram Calvet
0000-0002-1606-4645
3 papers found
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Dangling Bond Defects on Si Surfaces and Their Consequences on Energy Band Diagrams: From a Photoelectrochemical Perspective
Sputtered Nickel Oxide Thin Films on n-Si(100)/SiO2 Surfaces for Photo-Electrochemical Oxygen Evolution Reaction (OER): Impact of Deposition Temperature on OER Performance and on Composition before and after OER
In situ investigation of as grown Cu(In,Ga)Se2 thin films by means of photoemission spectroscopy
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