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Radiation Hardness Study of Silicon Carbide Sensors under High-Temperature Proton Beam Irradiations
Download from doi.orgThe Role of Dielectrophoresis for Cancer Diagnosis and Prognosis
Download from doi.orgA novel micro-Raman technique to detect and characterize 4H-SiC stacking faults
Download from www.researchgate.netEffects of the Growth Rate on the Quality of 4H Silicon Carbide Films for MOSFET Applications
Download from doi.orgMicro-Raman Characterization of 4H-SiC Stacking Faults
Download from doi.orgCurvature Evaluation of Si/3C-SiC/Si Hetero-Structure Grown by Chemical Vapor Deposition
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