Maria Isabel Alonso
Universität Stuttgart
120 papers found
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Ellipsometry on Very Thick Multilayer Structures
UploadCharacterisation of complex multilayer structures using spectroscopic ellipsometry
Download from www.researchgate.netDoping dependence of the ellipsometric spectra of Nd2−xCexCuO4−δ single crystals
Download from www.researchgate.netOptical determination of growth variants in ordered GaInP
UploadEllipsometric measurement of the dielectric tensor ofNd2−xCexCuO4−δ
Download from www.researchgate.netDetermination of the dielectric tensor in anisotropic materials
Download from www.researchgate.netAnisotropies in the structural properties of strained (311) (In,Ga)As/GaAs-heterostructures
Download from www.researchgate.netInvestigation of InAs submonolayer and monolayer structures on GaAs(100) and (311) substrates
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