Emiliano Bonera
0000-0003-1267-8508
64 papers found
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Raman spectroscopy for a micrometric and tensorial analysis of stress in silicon
Development of a combined confocal and scanning near‐field Raman microscope for deep UV laser excitation
EPR and UV-Raman study of BPSG thin films: structure and defects
Near-Field Optical Imaging of Electromigration Damages in Passivated Metal Stripes
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