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Erratum to: The effect of bias-temperature stress on Na+ incorporation into thin insulating films
Download from link.springer.comThe separation of grain and grain boundary impedance in thin yttria stabilized zirconia (YSZ) layers
Download from www.researchgate.netMeasurement of 18O tracer diffusion coefficients in thin yttria stabilized zirconia films
Download from www.researchgate.netMonitoring Active and Resistive Zones of SOFC Cathodes by Voltage Driven Tracer Incorporation
Download from iopscience.iop.orgParameterization of an electrical battery model for dynamic system simulation in electric vehicles
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