Daniel F. Sunday
National Institute of Standards and Technology
35 papers found
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X-ray Metrology for the SemiconductorIndustry Tutorial
Download from doi.orgXi-cam: a versatile interface for data visualization and analysis
Download from cloudfront.escholarship.orgAdvancing x-ray scattering metrology using inverse genetic algorithms
Download from europepmc.orgMissing publications? Search for publications with a matching author name.