Matthew Linford
0000-0003-0460-041X
Brigham Young University
12 papers found
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Following the propagation of erroneous x-ray photoelectron spectroscopy peak fitting through the literature. A genealogical approach
New challenges associated with hard X‐ray photoelectron spectroscopy (report on the 2023 ASTM E42‐ASSD AVS workshop)
Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature
Perspective on improving the quality of surface and material data analysis in the scientific literature with a focus on x-ray photoelectron spectroscopy (XPS)
Erratum: “Practical guide for curve fitting in x-ray photoelectron spectroscopy” [J. Vac. Sci. Technol. A 38, 061203 (2020)]
Definition of a new (Doniach‐Sunjic‐Shirley) peak shape for fitting asymmetric signals applied to reduced graphene oxide/graphene oxide XPS spectra
The Often-Overlooked Power of Summary Statistics in Exploratory Data Analysis: Comparison of Pattern Recognition Entropy (PRE) to Other Summary Statistics and Introduction of Divided Spectrum-PRE (DS-PRE)
Box plots: A simple graphical tool for visualizing overfitting in peak fitting as demonstrated with X-ray photoelectron spectroscopy data
A discussion of approaches for fitting asymmetric signals in X‐ray photoelectron spectroscopy (XPS), noting the importance of Voigt‐like peak shapes
ERRATUM: “Versailles project on advanced materials and standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene” [J. Vac. Sci. Technol. A 38, 063208 (2020)]
Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene
Assessment of the frequency and nature of erroneous x-ray photoelectron spectroscopy analyses in the scientific literature
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