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Gate Bias and Length Dependences of Total Ionizing Dose Effects in InGaAs FinFETs on Bulk Si
UploadTotal Ionizing Dose Effects in 70-GHz Bandwidth Photodiodes in a SiGe Integrated Photonics Platform
Download from ieeexplore.ieee.orgCapacitance–Frequency Estimates of Border-Trap Densities in Multifin MOS Capacitors
UploadDegradation and annealing effects caused by oxygen in AlGaN/GaN high electron mobility transistors
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