Chulmin Joo
0000-0002-1812-2976
Yonsei University
28 papers found
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Spectral domain polarization-sensitive optical coherence tomography at 850 nm
Fluid flow analysis in microfluidic devices by spectral-domain optical Doppler tomography
Thin-foil reflection gratings for Constellation-X
Advances in reflection grating technology for Constellation-X
Nanometer-level repeatable metrology using the Nanoruler
Nanometer-accurate Grating Fabrication with Scanning Beam Interference Lithography
Precision fringe metrology using a Fresnel zone plate
Beam alignment for scanning beam interference lithography
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