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Oxygen migration in TiO2-based higher-k gate stacks
Download from www.researchgate.netThermal Boundary Resistance Measurements for Phase-Change Memory Devices
Download from www.researchgate.netScaling the MOSFET gate dielectric: From high-k to higher-k? (Invited Paper)
Download from www.researchgate.netThickness and stoichiometry dependence of the thermal conductivity of GeSbTe films
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