Jan Kristen Prüßing
0000-0001-9216-4317
Westfälische Wilhelms-Universität
3 papers found
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Retarded boron and phosphorus diffusion in silicon nanopillars due to stress induced vacancy injection
Defect distribution in boron doped silicon nanostructures characterized by means of scanning spreading resistance microscopy
Quantitative scanning spreading resistance microscopy on n-type dopant diffusion profiles in germanium and the origin of dopant deactivation
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