Jonas Gertsch
www.colorado.edu
0000-0002-0626-9655
University of Colorado Boulder
2 papers found
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Direct Growth and Fabrication of Tungsten Coated GaN Nanowire Probes on Cantilevers for Scanning Probe Microscopy
In Situ Thermal Atomic Layer Etching for Sub-5 nm InGaAs Multigate MOSFETs
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