Ma Haitao
0000-0002-8299-6459
17 papers found
Refreshing results…
Enhancement of hardness of bulk solder by doping Cu nanoparticles at the interface of Sn/Cu solder joint
Growth behavior of preferentially scalloped intermetallic compounds at extremely thin peripheral Sn/Cu interface
Geometrical Effects of Cu@Ag Core–Shell Nanoparticles Treated Flux on the Growth Behaviour of Intermetallics in Sn/Cu Solder Joints
Geometrical effects on growth kinetics of interfacial intermetallic compounds in Sn/Cu joints reflowed with Cu nanoparticles doped flux
Effect of the $\text {TiO}_2$ TiO 2 Nanoparticles on the Growth Behavior of Intermetallics in Sn/Cu Solder Joints
All-round suppression of Cu6Sn5 growth in Sn/Cu joints by utilizing TiO2 nanoparticles
Synthesis of Cu@Ag core–shell nanoparticles for characterization of thermal stability and electric resistivity
Evolution behavior and growth kinetics of intermetallic compounds at Sn/Cu interface during multiple reflows
Study of electrochemical migration based transport kinetics of metal ions in Sn-9Zn alloy
Roles of interfacial heat transfer and relative solder height on segregated growth behavior of intermetallic compounds in Sn/Cu joints during furnace cooling
Shielding effect of Ag3Sn on growth of intermetallic compounds in isothermal heating and cooling during multiple reflows
Heat and mass transfer effects of laser soldering on growth behavior of interfacial intermetallic compounds in Sn/Cu and Sn-3.5Ag0.5/Cu joints
Synchrotron radiation imaging study on the rapid IMC growth of Sn–xAg solders with Cu and Ni substrates during the heat preservation stage
Size effect on IMC growth induced by Cu concentration gradient and pinning of Ag 3 Sn particles during multiple reflows
Geometrical outline evolution and size-inhibiting interaction of interfacial solder bubbles and IMCs during multiple reflows
Effect of initial Cu concentration on the IMC size and grain aspect ratio in Sn–xCu solders during multiple reflows
In situ study on growth behavior of interfacial bubbles and its effect on interfacial reaction during a soldering process
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