Tomasz Koltunowicz
0000-0001-7480-4931
Lublin University of Technology
86 papers found
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Jump Mechanism of Electric Charge Transfer in Gallium Arsenide Exposed to Polyenergy Implantation with H + Ions
Influence of Annealing on the Electrical Properties of Cz-Si Wafers Previously Subjected to the Hydrogen Ion-Beam Treatment
Formation of Cone-Shaped Inclusions and Line Defects on the Cz-Si Wafer Surface by the Helium Implantation and DC Nitrogen Plasma Treatment
Effects of Fluences of Irradiation with 107 MeV Krypton Ions on the Recovery Charge of Silicon p(+)n-Diodes
Formation of Noncoil-Like Inductance in Nanocomposites (Fe0.45Co0.45Zr0.10)(x)(Al2O3)(1-x) Manufactured by Ion-Beam Sputtering of Complex Targets in Ar+O-2 Atmosphere
Hopping Conductance in Nanocomposites (Fe0.45Co0.45Zr0.10)(x)(Al2O3)(1-x) Manufactured by Ion-Beam Sputtering of Complex Target in Ar+O-2 Ambient Gas
The Features of Real Part of Admittance in the Nanocomposites (Fe45Co45Zr10)(x)(Al2O3)(100-x): Manufactured by the Ion-Beam Sputtering Technique with Ar Ions
Peculiarities of conductivity, structure and magnetization of oxidized FeCoZr-Al2O3 granular nanocomposites
An effect of annealing on electric properties of nanocomposites (CoFeZr)(x)(Al2O3)(1-x) produced by magnetron sputtering in the atmosphere of argon and oxygen beyond the percolation threshold
Conductivity of Cd1-xFexTe semiconductors at alternating current and temperatures lower than the room temperature
Imaginary part of admittance in (Fe0.45Co0.45Zr0.10)(x)(Al2O3)((1-x)) nanocomposites
Magnetic properties of nanocomposites (CoFeZr)(x)(Al2O3)(1-x)
FORMATION OF COILLESS INDUCTION IN (Co45Fe45Zr10)(49.5)(Al2O3)(50.5) NANOCOMPOSITES
Investigations of a microrelief of a surface of chemically deposited matrixes SiO2 - carriers of functional elements for optoelectronics
Hopping conductivity of metal-dielectric nanocomposites produced by means of magnetron sputtering with the application of oxygen and argon ions
SEM and SIMS study of the buried SixNy layer formed in silicon
Effect of the hydrogen and argon ion-beam treatments on the structural and electrical properties of Cz Si wafers: Comparative study
Electrical properties of nanostructures (CoFeZr)x+(Al2O3)1−x with use of alternating current
The effect of annealing on electrical properties of (CoFeZr)(x)+(Al(2)O(3))(1-x) nanocomposites
Physical modification of filler of elastomer compositions
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