Pierre Godard
0000-0002-5402-6033
University of Poitiers
3 papers found
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In situ compression of micropillars under coherent X-ray diffraction: a case study of experimental and data-analysis constraints
X-ray diffraction and stress relaxations to study thermal and stress-assisted annealings in nanocrystalline gold thin films
In situ x-ray diffraction analysis of 2D crack patterning in thin films
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