Paulo Sergio Pizani
University of Sao Paulo
211 papers found
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Raman probing of thermal damage depth profile in annealed GaAs
UploadMBE growth and Raman analysis of [hhk]GaAs/(Si or CaF2) highly strained hetero-structures
Download from www.researchgate.netHigh strain effects evidenced by Raman scattering in arsenic clusters in As‐implanted GaAs
Download from www.researchgate.netStrain relaxation in [001]‐ and [111]‐GaAs/CaF2analyzed by Raman spectroscopy
Download from www.researchgate.netRaman scattering study of [hhk]‐GaAs/(Si or CaF2) strained heterostructures
Download from www.researchgate.netAu and AuZn contacts on p-GaSb and the characteristics of the interfaces
Download from www.researchgate.netMultiple Phase Silicon in Submicrometer Chips Removed by Diamond Turning
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