Nikolay Cherkashin
CNRS Délégation Midi-Pyrénées
144 papers found
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Electron microscopy by specimen design: application to strain measurements
Download from doi.orgCarrier transport and emission efficiency in InGaN quantum-dot based light-emitting diodes
UploadCracks and blisters formed close to a silicon wafer surface by He-H co-implantation at low energy
Download from hal.archives-ouvertes.frModelling of point defect complex formation and its application to H+ ion implanted silicon
Download from www.researchgate.netRealistic model of LED structure with InGaN quantum-dots active region
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