Maria Ruzzarin
0000-0003-4098-4297
6 papers found
Refreshing results…
3D integration technologies for custom SiPM: From BSI to TSV interconnections
Highly stable threshold voltage in GaN nanowire FETs: The advantages of p-GaN channel/Al2O3 gate insulator
Demonstration of UV-Induced Threshold Voltage Instabilities in Vertical GaN Nanowire Array-Based Transistors
Gate Reliability of p-GaN Gate AlGaN/GaN High Electron Mobility Transistors
Degradation Mechanisms of GaN HEMTs With p-Type Gate Under Forward Gate Bias Overstress
Instability of Dynamic- $R_{\text ON}$ and Threshold Voltage in GaN-on-GaN Vertical Field-Effect Transistors
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