Patrick Philipp
www.mendeley.com
0000-0001-5219-5178
Luxembourg Institute of Science and Technology
5 papers found
Refreshing results…
Roadmap for focused ion beam technologies
Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope
Highly-efficient growth of cobalt nanostructures using focused ion beam induced deposition under cryogenic conditions: application to electrical contacts on graphene, magnetism and hard masking
Optimization of Pt-C Deposits by Cryo-FIBID: Substantial Growth Rate Increase and Quasi-Metallic Behaviour
Correlative microscopy combining transmission electron microscopy and secondary ion mass spectrometry: A general review on the state-of-the-art, recent developments, and prospects
Missing publications? Search for publications with a matching author name.