Lok Yi Lee
0000-0002-4065-2084
University of Cambridge
4 papers found
Refreshing results…
Defect structures in (001) zincblende GaN/3C-SiC nucleation layers
Investigation of stacking faults in MOVPE-grown zincblende GaN by XRD and TEM
Effect of growth temperature and V/III-ratio on the surface morphology of MOVPE-grown cubic zincblende GaN
Effect of stacking faults on the photoluminescence spectrum of zincblende GaN
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