Reydezel Torres-Torres
0000-0003-0906-4038
INSTITUTO NACIONAL DE ASTROFISICA OPTICA Y ELECTRONICA
91 papers found
Refreshing results…
Characterization of the Intrinsic and Extrinsic Resistances of a Microwave Graphene FET Under Zero Transconductance Conditions
MIM capacitors as simple test vehicles for the DC/AC characterization of ALD-Al2O3 with auto-correction of parasitic inductance
Identifying the Loss Components Contributing to the Series Resistance of Shielded On-Chip Coplanar Waveguide Interconnects
Modeling Ground-Shielded Integrated Inductors Incorporating Frequency-Dependent Effects and Considering Multiple Resonances
Some Considerations Regarding the Modeling and Characterization of Bulk CMOS Devices for High-Frequency Applications
Characterizing 10 nm node based BEOL interconnects at low-frequency regime based on a transmission-line modelling approach
Characterization of Transmission Lines on PCB from S-Parameters by Determining the Dielectric and Conductor Losses at the Crossover Frequency
Assessment of coupled transmission lines embedded between imperfectly matched differential circuit stages
Modeling and Parameter Extraction for the Metal Surface Roughness Loss Effect on Substrate Integrated Waveguides From S-Parameters
Semiempirical Model for IC Interconnects Considering the Coupling Between the Signal Trace and the Ground Plane
Extraction of Frequency-Dependent Characteristic Impedance and Complex Permittivity in Single-Ended and Edge-Coupled Transmission Lines Using the Calculated Series Parasitic Effects
Accurate modeling of gate tunneling currents in Metal-Insulator-Semiconductor capacitors based on ultra-thin atomic-layer deposited Al2O3 and post-metallization annealing
Resistive switching characteristics of MIM structures based on oxygen-variable ultra-thin HfO 2 and fabricated at low temperature
Scalable models to represent the via-pad capacitance and via-traces inductance in multilayer PCB high-speed interconnects
Impact of neglecting the metal losses on the extraction of the relative permittivity from PCB transmission line measurements
Modeling the Frequency-Dependent Series Parasitics of Ground–Signal–Ground Pads Used to Probe On-Wafer Microstrip-Line-Fed Devices
Assessing the accuracy of the open, short and open-short de-embedding methods for on-chip transmission line S-parameters measurements
Analytical model parameter determination for microwave on-chip inductors up to the second resonant frequency
On the extraction methods for MOSFET series resistance and mobility degradation using a single test device
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters
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