Tim Niewelt
0000-0002-0360-2942
4 papers found
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Electronic Band Offset Determination of Oxides Grown by Atomic Layer Deposition on Silicon
Mechanisms of Silicon Surface Passivation by Negatively Charged Hafnium Oxide Thin Films
Extraordinarily High Minority Charge Carrier Lifetime Observed in Crystalline Silicon
Radiative recombination in silicon photovoltaics: Modeling the influence of charge carrier densities and photon recycling
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