Po Renault
0000-0002-0736-2333
University of Poitiers
4 papers found
Refreshing results…
Link between cracking mechanisms of trilayer films on flexible substrates and electro-mechanical reliability under biaxial loading
X-ray diffraction and stress relaxations to study thermal and stress-assisted annealings in nanocrystalline gold thin films
In situ x-ray diffraction analysis of 2D crack patterning in thin films
Continuous cyclic deformations of a Ni/W film studied by synchrotron X-ray diffraction
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